bist coding
2016-08-23
0 0 0
no vote
Other
Earn points
a built-in self repair analyzer
with the optimal repair rate for memory arrays with redundancy.
The proposed method requires only a single test, even in the worst
case. By performing the must-repair analysis on the fly during
the test, it selectively stores fault addresses, and the final analysis
to find a solution is performed on the stored fault addresses. To
enumerate all possible solutions, existing techniques use depth
first search using a stack and a finite-state machine. Instead, we
propose a new algorithm and its combinational circuit implementation.
with the optimal repair rate for memory arrays with redundancy.
The proposed method requires only a single test, even in the worst
case. By performing the must-repair analysis on the fly during
the test, it selectively stores fault addresses, and the final analysis
to find a solution is performed on the stored fault addresses. To
enumerate all possible solutions, existing techniques use depth
first search using a stack and a finite-state machine. Instead, we
propose a new algorithm and its combinational circuit implementation.
vhdl
Related Source Codes
EE247 Analysis and design of analog-to-digital int
0
0
no vote
Beiyou digital experiment parking lot
0
0
no vote
Clock frequency division design
0
0
no vote
FIR filter based on FPGA
0
0
no vote
Cameralink modulation and demodulation source code
0
0
no vote
No comment