a built-in self repair analyzer
with the optimal repair rate for memory arrays with redundancy.
The proposed method requires only a single test, even in the worst
case. By performing the must-repair analysis on the fly during
the test, it selectively stores fault addresses, and the final analysis
to find a solution is performed on the stored fault addresses. To
enumerate all possible solutions, existing techniques use depth
first search using a stack and a finite-state machine. Instead, we
propose a new algorithm and its combinational circuit implementation.