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A NOVEL ARCHITECTURE OF LUT DESIGN OPTIMIZATION FO
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Several memory based algorithms for DSP implementation have been reported in the literature, involving orthogonal transform and digital filter. Multiplication is in signal processing and ALU. The main operation of multiplier is LUT. However, we did not find any significant working memory LUT optimized multiplication. This paper presents a new design method of look-up table, in which only odd multiple storage (OMS) is used. In addition, the anti symmetric product coding (APC) method, LUT reduced by half, provides a reduction. When APC method is combined with OMS technology, the operation of two complements can be simplified, because the input address and LUT output can be converted into odd numbers, thus reducing the conventional LUT size by a quarter lut.the LUT multiplier presents word size = w = 5 and 6 bits encoded by Verilog and synthesized in Xilinx 13.4. It is found that LUT based multiplier is the same size and time complexity as 8-bit word, but higher word size, which involves less multiplication time than CSD based multiplier. For 16 bit and 32-bit word sizes, respectively, provide delay products over area savings in the corresponding CSD multiplier of 30% and 50%.
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A High Bit Rate Serial-Serial Multiplier With On-t
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A new method of serial hybrid design
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A new parallel multiplier with VLSI Architecture -- Booth algorithm based on Radix 2 modification fo
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In this paper, we propose a new architecture
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A test function using Verilog array architecture f
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Application background When built-in test generation is used for a
design that can be partitioned into logic blocks, it is advantageous to
identify groups of blocks whose tests have similar characteristics, and use the
same built-in test generation logic for the blocks in each group. This paper
studies this issue for a built-in test generation method that produces
functional broadside tests. Functional broadside tests are important for addressing
over testing of delay faults as well as avoiding excessive power dissipation
during test application. The paper discusses the design of the test generation
logic for a group of logic blocks, and the selection of the groups. Key Technology
Functional broadside
tests [4] ensure that the scan-in state is a state that the circuit can enter
during functional operation, or a reachable state. As broadside tests [5], they
operate the ci
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Input vector parallel BIST structure monitoring
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Application background Input vector monitoring concurrent built-in self test (BIST)
schemes perform testing during the normal operation of the circuit
without imposing a need to set the circuit offline to perform the test.
These schemes are evaluated based on the hardware overhead and the
concurrent test latency (CTL), i.e., the time required for the test to
complete, whereas the circuit operates normally. In this brief, we present
a novel input vector monitoring concurrent BIST scheme, which is based
on the idea of monitoring a set (called window) of vectors reaching the
circuit inputs during normal operation, and the use of a static-RAMlike
structure to store the relative locations of the vectors that reach the
circuit inputs in the examined window; the proposed scheme is shown
to perform significantly better than previously proposed schemes with
respect to the hardware overhead an
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New window monitor and control BIST
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Application background Input vector monitoring concurrent built-in self test (BIST)
schemes perform testing during the normal operation of the circuit
without imposing a need to set the circuit offline to perform the test.
These schemes are evaluated based on the hardware overhead and the
concurrent test latency (CTL), i.e., the time required for the test to
complete, whereas the circuit operates normally. Key Technology Built-in self test (BIST) techniques constitute a class of schemes
that provide the capability of performing at-speed testing with high
fault coverage, whereas simultaneously they relax the reliance on
expensive external testing equipment.
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Privacy Preserving Data Sharing With Anonymous ID
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Algorithm for anonymous data sharing between private parties. This technique is used iteratively to assign these node ID numbers from 1 to 2. This task is anonymous in the group received by other members with unknown identity. The collusion resistance between other members is verified by using private communication channels in the theoretical sense of information. The sequence number of this assignment allows for more complex data sharing, with privacy protection for applications in other issues, data mining, communication and distributed database access, avoiding collisions. The required computation is distributed without the use of a trusted central authority. Existing and new algorithms are used to assign anonymous IDs to communicate between trade-offs and to safely sum data mining operations using Newton identities and stum theorem checking. Some polynomial algorithms over finite fields of a distributed solution improve the scalability of the algorithm. Markov chains represent the statistics and computer algebra used to find the number of iterations required on the search, and give closed form results for the completion rate.
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A NEW AND EFFICIENT ALGORITHM FOR THE REMOVAL OF H
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Adaptive median is a "decision-making" or "on-off" filter, which first determines the possible noise points, then uses median filter and its variants, and keeps all other pixels unchanged to replace them. The filter is very good even in ahigh noise detection. The adaptive structure of the filter can ensure that the most impulse noise can be detected even when the window size is large enough and the noise level is high enough. Like standard median filter (SMF), existing nonlinear filter, adaptive median filter (AMF), decision based algorithm (DBA) and robust estimation algorithm (REA) show better performance in low and medium noise density. At high noise density, its performance is poor. Re algorithm for removing high density salt and using modified pure ranking method and decision based on UN symmetrical trimmed median filter (DBM) salt and pepper noise is proposed.
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Implementation of LSB Steganography and its Evalua
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Steganography is the art of hiding information in information is gaining momentum as it scores over cryptography because it enables to embedd the secret message to cover images. Steganographic techniques offer more promise in digital image processing. The Least Significant Bit embedding technique suggests that data can be hidden in the least significant bits of the cover image and the human eye would be unable to notice the hidden image in the cover file. This technique can be used for hiding images in 24-bit, 8-bit or gray scale format. We emphasize strongly on image Steganography providing a strong focus on the LSB techniques in image Steganography. This paper explains the LSB embedding technique and presents the evaluation results for 2,4,6 Least significant bits for a .pngfile and a .bmp file.
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