this is the verilog code for discrete cosine trans
no vote
Absrtact: fault diagnosis plays an important role in physics, fault analysis and output learning process. With tens of billions of transistors being integrated on a single chip, multiple faults may exist. With multiple faults, fault shielding and reinforcement effects may appear. They may lead to invalidation of conventional diagnosis methods based on single fault, such as single location at a time (slat). If no popular slat method fails, a single stuckat can indicate the failure. In addition, a real Silicon defect may manifest as different failures in different failure mode models (DM), which can be invalid using the single failure model method slat in all failure modes. In this paper, we introduce the concept of fault element, support multiple fault models, and use fault element graph (FEG) to consider the influence of fault shielding and reinforcement between multiple faults. Based on all failed fegs patterns, the most likely fault location and fault factors are repeatedly identified. At the same time, fegs are iteratively pruning the effects of the remaining faults until all fault points are determined and all fegs are reduced to null. The experimental results show that the method can identify multiple faults, and DM has high diagnosis accuracy and resolution. Key words: fault diagnosis, fault element, fault element diagram (FEG), multiple fault modes, multiple faults.