Modern advanced microprocessors have very high integration and complexity, as well as register heap,
2016-08-23
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modern microprocessors have a very high degree of integration and complexity, there Register pile, Cache such as embedded components, but Chip few relatively small, There must be the self-test design and testing of other design code to simplify testing, fault coverage. This paper briefly discussed Key words microprocessor chip to the boundary-scan test as the mainstay, Since the test to add to the test design framework. Highlighting the boundary-scan chip design and chip decoder PLA and micro-controller procedures and the use of embedded ROM RA M structure of the instruction cache and register stack of built-in self-test design. The simulation results show that these tests can greatly shorten the design of the test code length.
word
非常
集成度
复杂度
寄存器
Cache
嵌入式
而且
芯片
管脚数
相对
须要
测试
设计
可测
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